High-Resolution Transmission Electron Microscope

JEOL JEM-2011-HR

tem_ii-sc_1.jpg
  • Transmission Electron Microscopy (BF, DF, HRTEM)
  • Electron Diffraction (SAED, CBED, nanodiffraction)
  • Energy-Dispersive X-ray Spectroscopy (EDXS)
  • Oxford Instruments INCA Suite v.4.02, detection from Be on
  • Thermionic emitter (LaB6 crystal)
  • Acceleration voltage: 200 kV
  • Point-resolution: ≤0.23 nm (Cs= 1.0 mm)
  • Lattice resolution in HRTEM: ≤0.14 nm

 

 » Download all informations in one PDF-File

 

Contact:
Dr. Andreas Delimitis
Analytical Services Unit (ASU), Chemical Process & Energy Resources Institute (CPERI)
Centre for Research & Technology – Hellas (CERTH)

Charilaou - Thermi road
57001 Thermi, Thessaloniki
Greece
Tel: +30 / 2310 / 498259
Fax: +30 / 2310 / 498131
andel_at_cperi.certh.gr
http://www.cperi.certh.gr

Announcement

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Engineering Materials for Catalysis 
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8th Enmix Workshop,
Sept./Oct. 2020, Thessaloniki, Greece
postponed by one year

 

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