- Transmission Electron Microscopy (BF, DF, HRTEM)
- Scanning Transmission Electron Microscopy (STEM with BF, HAADF)
- Electron Diffraction (SAED, CBED, also energy-filtered)
- Energy-Filtered Transmission Electron Microscopy (EFTEM)
- Electron Energy Loss Spectroscopy (EELS, ELNES), Gatan Imaging Filter, GIF 2001, with 1k-CCD Camera
- Energy-Dispersive X-ray Spectroscopy (EDXS), Oxford Instruments INCA 200, detection from Be on
- Schottky field-emitter(ZrO/W(100))
- Acceleration voltage: 200 kV (160 kV)
- Point-resolution: ≤0.19 nm (Cs= 0.5 mm)
- Lattice resolution in STEM: ≤0.2 nm
- Energy resolution in EELS: ≤0.7 eV
» Download all informations in one PDF-File
Contact:
Dr. Armin Feldhoff
Institut für Physikalische Chemie und Elektrochemie
Leibniz-Universität Hannover
Callinstraße 3-3 A
30167 Hannover
Germany
Tel: +49 / 511 / 762-2940
Fax: +49 / 511 / 762-19121
armin.feldhoff_at_pci.uni-hannover.de
http://www.pci.uni-hannover.de
